| /* SPDX-License-Identifier: GPL-2.0+ */ | |
| /* | |
| * linux/include/linux/mtd/bbm.h | |
| * | |
| * NAND family Bad Block Management (BBM) header file | |
| * - Bad Block Table (BBT) implementation | |
| * | |
| * Copyright © 2005 Samsung Electronics | |
| * Kyungmin Park <kyungmin.park@samsung.com> | |
| * | |
| * Copyright © 2000-2005 | |
| * Thomas Gleixner <tglx@linuxtronix.de> | |
| * | |
| */ | |
| #ifndef __LINUX_MTD_BBM_H | |
| #define __LINUX_MTD_BBM_H | |
| /** | |
| * struct nand_bbt_descr - bad block table descriptor | |
| * @options: options for this descriptor | |
| * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE | |
| * when bbt is searched, then we store the found bbts pages here. | |
| * Its an array and supports up to 8 chips now | |
| * @offs: offset of the pattern in the oob area of the page | |
| * @veroffs: offset of the bbt version counter in the oob are of the page | |
| * @version: version read from the bbt page during scan | |
| * @len: length of the pattern, if 0 no pattern check is performed | |
| * @maxblocks: maximum number of blocks to search for a bbt. This number of | |
| * blocks is reserved at the end of the device where the tables are | |
| * written. | |
| * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than | |
| * bad) block in the stored bbt | |
| * @pattern: pattern to identify bad block table or factory marked good / | |
| * bad blocks, can be NULL, if len = 0 | |
| * | |
| * Descriptor for the bad block table marker and the descriptor for the | |
| * pattern which identifies good and bad blocks. The assumption is made | |
| * that the pattern and the version count are always located in the oob area | |
| * of the first block. | |
| */ | |
| struct nand_bbt_descr { | |
| int options; | |
| int pages[CONFIG_SYS_NAND_MAX_CHIPS]; | |
| int offs; | |
| int veroffs; | |
| uint8_t version[CONFIG_SYS_NAND_MAX_CHIPS]; | |
| int len; | |
| int maxblocks; | |
| int reserved_block_code; | |
| uint8_t *pattern; | |
| }; | |
| /* Options for the bad block table descriptors */ | |
| /* The number of bits used per block in the bbt on the device */ | |
| #define NAND_BBT_NRBITS_MSK 0x0000000F | |
| #define NAND_BBT_1BIT 0x00000001 | |
| #define NAND_BBT_2BIT 0x00000002 | |
| #define NAND_BBT_4BIT 0x00000004 | |
| #define NAND_BBT_8BIT 0x00000008 | |
| /* The bad block table is in the last good block of the device */ | |
| #define NAND_BBT_LASTBLOCK 0x00000010 | |
| /* The bbt is at the given page, else we must scan for the bbt */ | |
| #define NAND_BBT_ABSPAGE 0x00000020 | |
| /* bbt is stored per chip on multichip devices */ | |
| #define NAND_BBT_PERCHIP 0x00000080 | |
| /* bbt has a version counter at offset veroffs */ | |
| #define NAND_BBT_VERSION 0x00000100 | |
| /* Create a bbt if none exists */ | |
| #define NAND_BBT_CREATE 0x00000200 | |
| /* | |
| * Create an empty BBT with no vendor information. Vendor's information may be | |
| * unavailable, for example, if the NAND controller has a different data and OOB | |
| * layout or if this information is already purged. Must be used in conjunction | |
| * with NAND_BBT_CREATE. | |
| */ | |
| #define NAND_BBT_CREATE_EMPTY 0x00000400 | |
| /* Write bbt if neccecary */ | |
| #define NAND_BBT_WRITE 0x00002000 | |
| /* Read and write back block contents when writing bbt */ | |
| #define NAND_BBT_SAVECONTENT 0x00004000 | |
| /* Search good / bad pattern on the first and the second page */ | |
| #define NAND_BBT_SCAN2NDPAGE 0x00008000 | |
| /* Search good / bad pattern on the last page of the eraseblock */ | |
| #define NAND_BBT_SCANLASTPAGE 0x00010000 | |
| /* | |
| * Use a flash based bad block table. By default, OOB identifier is saved in | |
| * OOB area. This option is passed to the default bad block table function. | |
| */ | |
| #define NAND_BBT_USE_FLASH 0x00020000 | |
| /* | |
| * Do not store flash based bad block table marker in the OOB area; store it | |
| * in-band. | |
| */ | |
| #define NAND_BBT_NO_OOB 0x00040000 | |
| /* | |
| * Do not write new bad block markers to OOB; useful, e.g., when ECC covers | |
| * entire spare area. Must be used with NAND_BBT_USE_FLASH. | |
| */ | |
| #define NAND_BBT_NO_OOB_BBM 0x00080000 | |
| /* | |
| * Flag set by nand_create_default_bbt_descr(), marking that the nand_bbt_descr | |
| * was allocated dynamicaly and must be freed in nand_release(). Has no meaning | |
| * in nand_chip.bbt_options. | |
| */ | |
| #define NAND_BBT_DYNAMICSTRUCT 0x80000000 | |
| /* The maximum number of blocks to scan for a bbt */ | |
| #define NAND_BBT_SCAN_MAXBLOCKS 4 | |
| /* | |
| * Constants for oob configuration | |
| */ | |
| #define NAND_SMALL_BADBLOCK_POS 5 | |
| #define NAND_LARGE_BADBLOCK_POS 0 | |
| #define ONENAND_BADBLOCK_POS 0 | |
| /* | |
| * Bad block scanning errors | |
| */ | |
| #define ONENAND_BBT_READ_ERROR 1 | |
| #define ONENAND_BBT_READ_ECC_ERROR 2 | |
| #define ONENAND_BBT_READ_FATAL_ERROR 4 | |
| /** | |
| * struct bbm_info - [GENERIC] Bad Block Table data structure | |
| * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry | |
| * @badblockpos: [INTERN] position of the bad block marker in the oob area | |
| * @options: options for this descriptor | |
| * @bbt: [INTERN] bad block table pointer | |
| * @isbad_bbt: function to determine if a block is bad | |
| * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for | |
| * initial bad block scan | |
| * @priv: [OPTIONAL] pointer to private bbm date | |
| */ | |
| struct bbm_info { | |
| int bbt_erase_shift; | |
| int badblockpos; | |
| int options; | |
| uint8_t *bbt; | |
| int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); | |
| /* TODO Add more NAND specific fileds */ | |
| struct nand_bbt_descr *badblock_pattern; | |
| void *priv; | |
| }; | |
| /* OneNAND BBT interface */ | |
| extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd); | |
| extern int onenand_default_bbt(struct mtd_info *mtd); | |
| #endif /* __LINUX_MTD_BBM_H */ |