| /* SPDX-License-Identifier: GPL-2.0+ */ | |
| /* | |
| * Copyright (c) 2013 Google, Inc. | |
| */ | |
| #ifndef __TEST_TEST_H | |
| #define __TEST_TEST_H | |
| #include <malloc.h> | |
| #include <linux/bitops.h> | |
| /* | |
| * struct unit_test_state - Entire state of test system | |
| * | |
| * @fail_count: Number of tests that failed | |
| * @start: Store the starting mallinfo when doing leak test | |
| * @of_live: true to use livetree if available, false to use flattree | |
| * @of_root: Record of the livetree root node (used for setting up tests) | |
| * @root: Root device | |
| * @testdev: Test device | |
| * @force_fail_alloc: Force all memory allocs to fail | |
| * @skip_post_probe: Skip uclass post-probe processing | |
| * @expect_str: Temporary string used to hold expected string value | |
| * @actual_str: Temporary string used to hold actual string value | |
| */ | |
| struct unit_test_state { | |
| int fail_count; | |
| struct mallinfo start; | |
| struct device_node *of_root; | |
| bool of_live; | |
| struct udevice *root; | |
| struct udevice *testdev; | |
| int force_fail_alloc; | |
| int skip_post_probe; | |
| char expect_str[512]; | |
| char actual_str[512]; | |
| }; | |
| /* Test flags for each test */ | |
| enum { | |
| UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */ | |
| UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */ | |
| UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */ | |
| UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */ | |
| UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */ | |
| UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */ | |
| /* do extra driver model init and uninit */ | |
| UT_TESTF_DM = BIT(6), | |
| }; | |
| /** | |
| * struct unit_test - Information about a unit test | |
| * | |
| * @name: Name of test | |
| * @func: Function to call to perform test | |
| * @flags: Flags indicated pre-conditions for test | |
| */ | |
| struct unit_test { | |
| const char *file; | |
| const char *name; | |
| int (*func)(struct unit_test_state *state); | |
| int flags; | |
| }; | |
| /** | |
| * UNIT_TEST() - create linker generated list entry for unit a unit test | |
| * | |
| * The macro UNIT_TEST() is used to create a linker generated list entry. These | |
| * list entries are enumerate tests that can be execute using the ut command. | |
| * The list entries are used both by the implementation of the ut command as | |
| * well as in a related Python test. | |
| * | |
| * For Python testing the subtests are collected in Python function | |
| * generate_ut_subtest() by applying a regular expression to the lines of file | |
| * u-boot.sym. The list entries have to follow strict naming conventions to be | |
| * matched by the expression. | |
| * | |
| * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite | |
| * foo that can be executed via command 'ut foo bar' and is implemented in | |
| * function foo_test_bar(). | |
| * | |
| * @_name: concatenation of name of the test suite, "_test_", and the name | |
| * of the test | |
| * @_flags: an integer field that can be evaluated by the test suite | |
| * implementation | |
| * @_suite: name of the test suite concatenated with "_test" | |
| */ | |
| #define UNIT_TEST(_name, _flags, _suite) \ | |
| ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \ | |
| .file = __FILE__, \ | |
| .name = #_name, \ | |
| .flags = _flags, \ | |
| .func = _name, \ | |
| } | |
| /* Get the start of a list of unit tests for a particular suite */ | |
| #define UNIT_TEST_SUITE_START(_suite) \ | |
| ll_entry_start(struct unit_test, ut_ ## _suite) | |
| #define UNIT_TEST_SUITE_COUNT(_suite) \ | |
| ll_entry_count(struct unit_test, ut_ ## _suite) | |
| /* Use ! and ~ so that all tests will be sorted between these two values */ | |
| #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!) | |
| #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~) | |
| #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START()) | |
| /* Sizes for devres tests */ | |
| enum { | |
| TEST_DEVRES_SIZE = 100, | |
| TEST_DEVRES_COUNT = 10, | |
| TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT, | |
| /* A few different sizes */ | |
| TEST_DEVRES_SIZE2 = 15, | |
| TEST_DEVRES_SIZE3 = 37, | |
| }; | |
| /** | |
| * testbus_get_clear_removed() - Test function to obtain removed device | |
| * | |
| * This is used in testbus to find out which device was removed. Calling this | |
| * function returns a pointer to the device and then clears it back to NULL, so | |
| * that a future test can check it. | |
| */ | |
| struct udevice *testbus_get_clear_removed(void); | |
| static inline void arch_reset_for_test(void) | |
| { | |
| #ifdef CONFIG_SANDBOX | |
| #include <asm/state.h> | |
| state_reset_for_test(state_get_current()); | |
| #endif | |
| } | |
| #endif /* __TEST_TEST_H */ |